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Control charts and machine learning for anomaly detection in manufacturing

Tran, Kim Phuc ed.

Control charts and machine learning for anomaly detection in manufacturing - Switzerland: Springer, 2022 - vi, 269 p. - Springer eries in reliability engineering .

ISBN: 9783030838188

Subjects--Topical Terms:
Film & TV

Dewey Class. No.: 006.31 / T685C

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