Tran, Kim Phuc ed. <br/><br/>
Control charts and machine learning for anomaly detection in manufacturing 

 - Switzerland:  Springer,  2022 
 - vi, 269 p. 
 - Springer eries in reliability engineering .
<br/><br/><label>ISBN: </label>9783030838188 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Film & TV
<br/><br/><label>Dewey Class. No.: </label>006.31  / T685C